Handbook of Surface and Nanometrology, Second Edition by David J. Whitehouse

By David J. Whitehouse

Because the ebook of the 1st version, miniaturization and nanotechnology became inextricably associated with conventional floor geometry and metrology. This interdependence of scales has had profound sensible implications. up-to-date and accelerated to mirror many new advancements, guide of floor and Nanometrology, moment variation determines how the aid in scale of dimension from macro to nano has affected all points of floor use and size. The ebook discusses how this shift has prolonged via characterization, standardization, manufacture, and function. With nanotechnology now permeating the textual content, this variation covers new tools of construction and size in addition to new functionality requisites. defined because the father of electronic metrology by way of the yank Society for Precision Engineering, writer David J. Whitehouse explores the variety of floor dimension scales—macro, micro, nano, atomic, and mixtures of those. He examines conventional, dependent, patterned, and free-form surfaces, emphasizing the transforming into have to comprehend the habit of a number of surfaces. nonetheless the definitive reference within the box, the second one variation of this instruction manual maintains to supply in-depth, large insurance of the engineering, physics, fabrics, arithmetic, and computing all for floor metrology and nanometrology. not anything pertaining to present floor geometry escapes inclusion or scrutiny during this publication.

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Extra resources for Handbook of Surface and Nanometrology, Second Edition

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Note that at any one level the value of the material ratio curve (bearing ratio) is a ratio and not a length. It would give the same shaped curve if the horizontal scale of the profile were shrunk or expanded. Indeed it would give the same curve if the order of the tp values were exchanged or even pushed up against each other; the actual horizontal scale or order of the peaks horizontally is not relevant. A more detailed discussion of this method of assessing the material ratio curve is given in Chapter 5.

One of the simplest, called the high-spot count, is a measure of the number of crossings of the profile through the mean line z = 0. Various alternatives to the mean line crossings have been suggested. For instance, an index can be taken to be the number of crossings of the profile by a line parallel to the mean line but displaced vertically by one Ra value. 3 on statistical parameters. Whereas the high-spot count is referred to at a given height from the reference line within the profile, the peak count is not.

In general, the roughness includes the tool traverse feed marks such as are found in turning and grinding and the irregularities within them produced by microfracture, built-up edge on the tool, etc. The word “lay” is used to describe the direction of the predominant surface pattern. In practice it is considered to be most economical in effort to measure across the lay rather than along it, although there are exceptions to this rule, particularly in frictional problems or sealing (see Chapter 7).

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Handbook of Surface and Nanometrology, Second Edition by David J. Whitehouse
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